SEM (Scanning Electron Microscopy) is a technique that produces highly magnified images of a sample’s surface topography. Unlike optical microscopes, SEM offers much higher resolution, revealing intricate surface features at the micro and nanoscale.
EDS (Energy Dispersive X-ray Spectroscopy) is often coupled with SEM. It detects and identifies the elemental composition of the materials under investigation, providing a comprehensive understanding of the material’s chemistry.
Together, SEM and EDS help answer critical questions about material behavior, defects, and composition.